ESD Program
Management
Second Edition
G. Theodore Dangelmayer
Published: 1999, by Kluwer Academic Publishers
Pages: 471 Chapters: 20 Appendices: 4 Glossary: References: Index
The book is divided into the following chapters:
- 12 Critical Factors in managing ESD
- Common Myths
- Implementing an ESD Control Program: the Basic Steps
- Fundamentals of Electrostatics
- Economic Benefits: 7 Convincing Case Studies
- Designed-In Protection and Product Testing
- ESD Test Facilities
- Realistic Requirements
- Common Problems in Smaller Companies
- Guidelines for Smaller Companies: An Innovative System Audit
- Internal Auditing
- Using Auditing Results to Manage the ESD Program
- Statistical Process Control and ISO 9000
- Material Characterization and Auditing Measurements
- Purchasing Guidelines: Finding the Hidden Costs and Problems
- Training for Measurable Goals
- Training Demonstrations
- Packaging Considerations
- Automation
- Strategic and Economic Benefits
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TED DANGELMAYER |
Ted Dangelmayer has held leadership positions
such as Chairman of the Lucent Global ESD Leadership Team, President
of the International ESD Association, Chairman of the ANSI/ESDA Standards
Committee, and General Chairman of the EOS/ESD Symposium. Under Ted's
leadership, Lucent Technologies - North Andover, MA, was the first
site in the USA to become S20.20 certified. At the time, the Lucent
site had 2,000,000 square feet of floor space and 12,000 employees.
The lead DNV auditor was quoted as saying "I've audited literally
hundreds of ESD programs and, without a doubt, the Lucent program
is the best I have ever seen. It's a world class benchmark, and you
can quote me on that!"
Ted has published numerous magazine articles, technical papers and
two books. Ted holds two patents, is NARTE Certified, and has successfully
completed the ESD Association ANSI/ESDA S20.20 Course for Program
Managers and Consultants.
He is currently President of the Northeast Chapter of the ESD Association
and a member of the ESD Association International Council of Education
and 2003 Technical Program Committee. |
